Published February 15, 2006
| Version v1
Journal article
Depth profile dependence of domain configuration variations in Pb(Mg1/3Nb2/3)O3-PbTiO3 single crystals
- 1. State Key Laboratory of High Performance Ceramics and Superfine Microstructures, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 200050 (China)
Description
The domain structures of (0 0 1)-oriented Pb(Mg1/3Nb2/3)O3-33% PbTiO3 single crystal have been investigated by polarized optical microscopy, scanning electron acoustic microscopy and piezoresponse force microscopy. It was found that an averaged striped macro-domain distributions appears in the full-depth profile of the sample, lamellar domain structures in the subsurface of 2-3 μm depth profile and wavy domain patterns at near surface of ∼10 nm depth profile. These phenomenons demonstrate the presence of a domain complicacy on various depth scales ranging from nanometer to micrometer in the (0 0 1)-oriented PMN-33% PT single crystals
Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2005.09.053;
- PII
- S0921-5107(05)00651-3;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 127
- Journal Issue
- 1
- Journal Page Range
- p. 58-61
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37120779
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACOUSTIC MICROSCOPY; DEPTH; DISTRIBUTION; DOMAIN STRUCTURE; ELECTRON SCANNING; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MAGNESIUM COMPOUNDS; MONOCRYSTALS; NIOBATES; OPTICAL MICROSCOPY; SURFACES; TITANATES; VARIATIONS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CRYSTALS; DIELECTRIC MATERIALS; DIMENSIONS; MATERIALS; MICROSCOPY; NIOBIUM COMPOUNDS; OXYGEN COMPOUNDS; REFRACTORY METAL COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.