X-ray standing waves and hard X-ray photoelectron spectroscopy at the insertion device beamline ID32
Creators
- 1. European Synchrotron Radiation Facility, 6 rue Jules Horowitz, F-38000 Grenoble (France)
Description
Investigations on the geometrical structure, chemical composition and electronic properties of surfaces and interfaces are performed on beamline ID32 at the ESRF. It is a high resolution beamline covering the photon energy range 1.4-30 keV optimized for X-ray standing wave, surface X-ray diffraction, and hard X-ray photoelectron spectroscopy experiments. Fresnel zone plates and compound refractive lens systems are used to focus the monochromatic beam. After outlining the principles of X-ray standing wave measurements the unique features of the ID32 beamline are described. Future developments are discussed and finally some selected examples illustrating the advantages of combining the X-ray standing wave technique with hard X-ray photoelectron spectroscopy are presented.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2009.09.008Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2009.09.008;
- PII
- S0368-2048(09)00225-4;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 178-179
- Journal Page Range
- p. 258-267
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41085672
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- BEAMS; CHEMICAL COMPOSITION; EQUIPMENT; EUROPEAN SYNCHROTRON RADIATION FACILITY; FOURIER ANALYSIS; HARD X RADIATION; KEV RANGE; MONOCHROMATIC RADIATION; PHOTOELECTRON SPECTROSCOPY; PHOTONS; PLATES; RESOLUTION; STANDING WAVES; SURFACES; SYNCHROTRON RADIATION; X-RAY DIFFRACTION; ZONES
- Descriptors DEC
- BOSONS; BREMSSTRAHLUNG; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ENERGY RANGE; IONIZING RADIATIONS; MASSLESS PARTICLES; RADIATION SOURCES; RADIATIONS; SCATTERING; SPECTROSCOPY; SYNCHROTRON RADIATION SOURCES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.