The 600 °C and 750 °C isothermal sections of the Al–V–Zn system
- 1. Key Laboratory of Materials Design and Preparation Technology of Hunan Province, Xiangtan University, Hunan 411105 (China)
- 2. School of Mechanical Engineering, Xiangtan University, Hunan 411105 (China)
Description
Highlights: ► The 600 °C and 750 °C isothermal sections of Al–V–Zn ternary system are determined. ► A true ternary compound named T is confirmed in the Al-rich corner at 600 °C. ► The VZn3 phase still exists in the Al–V–Zn system at 750 °C. ► Nine three-phase regions are confirmed in the Al–V–Zn ternary system at 600 °C. ► Four three-phase regions exit in the 750 °C isothermal section. - Abstract: The 600 °C and 750 °C isothermal sections of Al–V–Zn ternary system have been determined experimentally by means of optical microscopy, scanning electron microscopy coupled with energy-dispersive spectrometry and X-ray diffraction. A true ternary compound named T, containing 8.1 to 11.4 at.% V, 3.2 to 18.3 at.% Zn, is confirmed in the Al-rich corner at 600 °C and it is in equilibrium with Al3V, Al23V4, Al45V7, Al21V2, α-Al and L–Zn. The VZn3 phase still exists in the Al–V–Zn system at 750 °C. Nine three-phase regions have been confirmed in the Al–V–Zn ternary system at 600 °C, and four three-phase regions exit in the 750 °C isothermal section.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2012.07.051Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2012.07.051;
- PII
- S0925-8388(12)01242-X;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 541
- Journal Page Range
- p. 204-209
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44108667
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- EQUILIBRIUM; OPTICAL MICROSCOPY; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIAGRAMS; DIFFRACTION; ELECTRON MICROSCOPY; INFORMATION; MICROSCOPY; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.