Laboratory EXAFS using photographic method
Creators
- 1. Government College, Badnawar (Dhar)-454660 (India)
- 2. School of Studies in Physics, Vikram University, Ujjain-456010 (India)
Description
Laboratory EXAFS facilities have been used since long. However, EXAFS data analysis has not been reported as yet for the spectra recorded photographically. Though from our laboratory we have been reporting various studies employing X-ray spectrographs using the photographic method of registration of EXAFS spectra, but the data has never been analyzed using the Fourier transformation method and fitting with standards. This paper reports the study of copper metal EXAFS spectra at the K-edge recorded photographically employing a 400 mm curved mica crystal Cauchois type spectrograph with 0.5 kW tungsten target X-ray tube. The data obtained in digital form with the help of a microphotometer has been processed using EXAFS data analysis programs Athena and Artemis. The experimental data for copper metal foil have been fitted with the theoretical standards. The results have been compared with those obtained from another laboratory EXAFS set up employing 12 kW Rigaku rotating anode, Johansson-type spectrometer with Si(311) monochromator crystal and scintillation counter. The results have also been compared with those obtained from SSRL. The parameters obtained for the first two shells from the photographic method are comparable with those obtained from the other two methods. The present work shows that the photographic method of registering EXAFS spectra in laboratory set up using fixed target X-ray tubes can also be used for getting structural information at least for the first two coordination shells.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/190/1/012044Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 190
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 14. international conference on X-ray absorption fine structure
- Acronym
- XAFS14
- Dates
- 26-31 Jul 2009
- Place
- Camerino (Italy)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42030032
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- A CODES; ABSORPTION SPECTROSCOPY; ANODES; COMPUTER CALCULATIONS; COPPER; CRYSTALS; DATA ANALYSIS; FINE STRUCTURE; FOILS; FOURIER TRANSFORMATION; MICA; PHOTOGRAPHY; SCINTILLATION COUNTERS; SILICON; TUNGSTEN; X-RAY SPECTROSCOPY; X-RAY TUBES
- Descriptors DEC
- COMPUTER CODES; ELECTRODES; ELECTRON TUBES; ELEMENTS; EQUIPMENT; INTEGRAL TRANSFORMATIONS; MEASURING INSTRUMENTS; METALS; MINERALS; RADIATION DETECTORS; REFRACTORY METALS; SEMIMETALS; SILICATE MINERALS; SPECTROSCOPY; TRANSFORMATIONS; TRANSITION ELEMENTS; X-RAY EQUIPMENT