Minimizing 'glitches' in XAFS data: A model for glitch formation
Creators
- 1. Dept. of Physics, Univ. of California, Santa Cruz, CA (United States)
- 2. Xerox PARC, Palo Alto, CA (United States)
Description
Spikes in X-ray absorption data, which are referred to as 'glitches', occur at particular monochromator energies for which multiple diffractions are possible. Measurements of the X-ray beam profile show that large spatial variations of the flux in the vertical direction occur at energies close to a glitch. We develop a simple model of glitch formation in ratioed X-ray absorption data, that shows why glitches remain in the ratioed data for ideal conditions (ideal detectors and no harmonics) if the sample is nonuniform. The model describes experimental observations well, including the occurrence of both negative and positive lobes in a glitch. Some ramifications of the model are presented and some means to minimize the glitches are discussed. The advantages of using pixel array detectors are also briefly presented. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A
- Journal Volume
- 307
- Journal Issue
- 2/3
- Series
- Nucl. Instrum. Methods Phys. Res., Sect. A.
- Journal Page Range
- 316-324
- ISSN
- 0168-9002
- CODEN
- NIMAE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 23028349
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; BACKGROUND RADIATION; BEAM PROFILES; ENERGY DEPENDENCE; FINE STRUCTURE; MATHEMATICAL MODELS; MINIMIZATION; MONOCHROMATORS; PHOTON BEAMS; POSITION SENSITIVE DETECTORS; RADIATION FLUX; SPATIAL DISTRIBUTION; X-RAY DETECTION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; DETECTION; DIFFRACTION; DISTRIBUTION; MEASURING INSTRUMENTS; OPTIMIZATION; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SCATTERING; SPECTROSCOPY