Published December 2015
| Version v1
Journal article
Analysis of microstructure by small-angle x-ray scattering
Description
no abstract available
Availability note (English)
Available from http://dx.doi.org/10.2320/materia.54.616Additional details
Identifiers
Publishing Information
- Journal Title
- Materia (Sendai)
- Journal Volume
- 54
- Journal Issue
- 12
- Journal Page Range
- p. 616-620
- ISSN
- 1340-2625
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 47090527
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ATOMIC NUMBER; MEASURING INSTRUMENTS; MEASURING METHODS; MICROSTRUCTURE; NANOSTRUCTURES; NEUTRON DIFFRACTION; RESEARCH PROGRAMS; SMALL ANGLE SCATTERING; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; SCATTERING
Optional Information
- Notes
- 21 refs., 6 figs.