Analysis of uranium distribution in rocks by μ-PIXE
Description
We examined distributions of U as well as P, Ca, Fe and Ti in rock samples collected at the Koongarra uranium deposit, Australia, using a micro-proton-induced X-ray emission (μ-PIXE) analyzing system developed in the TIARA facility of Japan Atomic Energy Research Institute (JAERI). The conventional scanning electron microscopy-energy dispersive X-ray spectrometry (SEM-EDS) was also applied to identify a U-bearing phosphate as saleeite, and to examine the distributions of the above elements to clarify relative advantages of μ-PIXE. The advantages of μ-PIXE are as follows: (1) the spatial resolution of μ-PIXE, about 0.8 μm2, is higher than that of SEM-EDS, about 7 μm2, (2) the contrast of elemental maps by μ-PIXE is better than that by SEM-EDS, (3) μ-PIXE detection of U using its L-line gives more reliable U distribution when clay minerals containing potassium are present. It is concluded that μ-PIXE is one of the best techniques that allows U to be accurately analyzed and mapped in K-bearing minerals, using its L-line
Additional details
Identifiers
- PII
- S0168583X01003810;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 181
- Journal Issue
- 1-4
- Journal Page Range
- p. 586-592
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 33054326
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S11: NUCLEAR FUEL CYCLE AND FUEL MATERIALS;
- Descriptors DEI
- CALCIUM; IRON; KOONGARRA DEPOSIT; ORE COMPOSITION; PHOSPHORUS; PIXE ANALYSIS; PROTON MICROPROBE ANALYSIS; TITANIUM; URANIUM
- Descriptors DEC
- ACTINIDES; ALKALINE EARTH METALS; CHEMICAL ANALYSIS; ELEMENTS; GEOLOGIC DEPOSITS; METALS; MICROANALYSIS; MINERAL RESOURCES; NONDESTRUCTIVE ANALYSIS; NONMETALS; RESOURCES; TRANSITION ELEMENTS; URANIUM DEPOSITS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.