Published January 1979
| Version v1
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Mechanical integrity of thin films
Description
Mechanical considerations starting with the initial film deposition including questions of adhesion and grading the interface are reviewed. Growth stresses, limiting thickness, stress relief, control aging, and creep are described
Files
Additional details
Publishing Information
- Imprint Title
- Thin film problems and research in energy systems
- Journal Page Range
- p. 49-54.
- Report number
- CONF-761168--(Summ.)
Conference
- Title
- ERDA/DPR symposium on thin-film research.
- Dates
- 1 - 3 Nov 1976.
- Place
- Pacific Grove, CA, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 10486994
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AGING; CREEP; FILMS; MECHANICAL PROPERTIES; STRESS ANALYSIS; SUBSTRATES; SURFACE COATING
- Descriptors DEC
- DEPOSITION