Published 1971
| Version v1
Book
Future of silicon x-ray detectors
Description
no abstract available
Additional details
Publishing Information
- Publisher
- American Society for Testing and Materials.
- Imprint Place
- Philadelphia
- Imprint Title
- Energy dispersion x-ray analysis: x-ray and electron probe analysis
- Imprint Pagination
- p. 36-56.
Conference
- Title
- x-ray and electron probe analysis.
- Acronym
- Symposium on energy dispersion x-ray analysis
- Dates
- 21 Jun 1970.
- Place
- Toronto, Ont, Canada.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 5148899
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ENERGY RESOLUTION; PERFORMANCE; SI SEMICONDUCTOR DETECTORS; X-RAY SPECTROMETERS
- Descriptors DEC
- MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SPECTROMETERS
Optional Information
- Notes
- Imprint:See ASTM-STP--485; CONF-700683--.