Published May 1983
| Version v1
Journal article
A new method for measuring the x-ray 'Pendelloesung' beats at the center of the Borrmann fan using white radiations
- 1. Hokkaido Univ., Sapporo (Japan). Faculty of Engineering
Description
A new technique is proposed to measure the X-ray Pendelloesung intensity beats using white radiations and parallel-sided single crystals. The beats are measured at the center of the Borrmann fan on the exit surface of a thick Si specimen. The atomic scattering factors of Si are determined for the 220 reflection with an accuracy remarkably higher than that in the previous method. (author)
Additional details
Publishing Information
- Journal Title
- Jpn. J. Appl. Phys., Part 2
- Journal Volume
- 22
- Journal Issue
- 5
- Series
- Jpn. J. Appl. Phys., Part 2.
- Journal Page Range
- L304-L306
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 15070454
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BRAGG REFLECTION; ENERGY SPECTRA; MEASURING METHODS; MONOCRYSTALS; SCATTERING; SILICON; TOPOLOGICAL MAPPING; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; REFLECTION; SEMIMETALS; SPECTRA; TRANSFORMATIONS