Details of 1π sr wide acceptance angle electrostatic lens for electron energy and two-dimensional angular distribution analysis combined with real space imaging
Creators
- 1. University of Debrecen, H-4032 Debrecen, Egyetem tér 1 (Hungary)
- 2. CREST, Japan Science and Technology Agency, Saitama 332-0012 (Japan)
- 3. Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 630-0192 (Japan)
Description
We propose a new 1π sr Wide Acceptance Angle Electrostatic Lens (WAAEL), which works as a photoemission electron microscope (PEEM), a highly sensitive display-type electron energy and two-dimensional angular distribution analyzer. It can display two-dimensional angular distributions of charged particles within the acceptance angle of ±60° that is much larger than the largest acceptance angle range so far and comparable to the display-type spherical mirror analyzer developed by Daimon et al. . It has good focusing capabilities with 5-times magnification and 27(4) μm lateral-resolution. The relative energy resolution is typically from 2 to 5×10-3 depending on the diameter of energy aperture and the emission area on the sample. Although, the lateral resolution of the presented lens is far from those are available nowadays, but this is the first working model that can form images using charged particles collected from 1π sr wide acceptance angle. The realization of such lens system is one of the first possible steps towards reaching the field of imaging type atomic resolution electron microscopy Feynman et al. Here some preliminary results are shown.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2011.09.018Additional details
Identifiers
- DOI
- 10.1016/j.nima.2011.09.018;
- PII
- S0168-9002(11)01770-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 661
- Journal Issue
- 1
- Journal Page Range
- p. 98-105
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44002329
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANGULAR DISTRIBUTION; CHARGED PARTICLES; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; ELECTROSTATIC LENSES; EMISSION SPECTROSCOPY; ENERGY RESOLUTION; MIRRORS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- DISTRIBUTION; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; EMISSION; FERMIONS; LENSES; LEPTONS; MICROSCOPES; MICROSCOPY; RESOLUTION; SECONDARY EMISSION; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.