Published March 2007 | Version v1
Journal article

Effects of the magnetic layer length on the high-frequency characteristics of an integrated-type coplanar wave-guide transmission line

  • 1. Nano Device Research Center, Korea Institute of Science and Technology, P.O. Box 131, Cheongryang, Seoul 130-650 (Korea, Republic of)
  • 2. Department of Electrical and Communication Engineering, Tohoku University, Sendai 980-7579 (Japan)
  • 3. Division of Materials Science and Engineering, Korea University, Seongbuk-gu, Seoul 136-713 (Korea, Republic of)

Description

Integrated-type electromagnetic noise suppressors, based on a coplanar wave-guide transmission line, are investigated, incorporated with a SiO2 dielectric and a nanogranular Co-Fe-Al-O magnetic thin film. The length of the magnetic thin film is varied from 2 to 15 mm, while its thickness and width are fixed at 1 and 50 μm, respectively. In the measurement frequency range of 0.1-20 GHz, no obvious resonance is seen at the shortest length of the magnetic thin film, but resonance behavior occurs at larger length. A very clear resonance occurs at the largest length of 15 mm, where the resonance frequency is ∼10 GHz and the signal attenuation is as large as -20 dB. The observed resonance frequency is much higher than the ferromagnetic resonance frequency and the main mechanism of loss generation is found to be L-C resonance

Additional details

Identifiers

DOI
10.1016/j.jmmm.2006.10.870;
PII
S0304-8853(06)02109-3;

Publishing Information

Journal Title
Journal of Magnetism and Magnetic Materials
Journal Volume
310
Journal Issue
2
Journal Page Range
p. 2563-2565
ISSN
0304-8853
CODEN
JMMMDC

Conference

Title
17. international conference on magnetism
Dates
20-25 Aug 2006
Place
Kyoto (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39026954
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM COMPOUNDS; COBALT COMPOUNDS; DIELECTRIC MATERIALS; FERROMAGNETIC RESONANCE; GHZ RANGE 01-100; IRON COMPOUNDS; LAYERS; NANOSTRUCTURES; OXIDES; SILICON OXIDES; THIN FILMS; WAVEGUIDES
Descriptors DEC
CHALCOGENIDES; FILMS; FREQUENCY RANGE; GHZ RANGE; MAGNETIC RESONANCE; MATERIALS; OXIDES; OXYGEN COMPOUNDS; RESONANCE; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.