Published 2000 | Version v1
Journal article

Synthesis and X-ray diffraction study of substituted La10(Si6O22N2)O2 silicon apatites

  • 1. Rennes-1 Univ. (France). Lab. de Chimie des Materiaux
  • 2. CRMHT, Orleans (France)

Description

The La10(Si6O22N2)O2 oxynitride has an apatite - type structure. The crystallographic sites, interatomic distances and cell parameters have been determined using the Rietveld method. The substitution of one lanthanum atom by many metals with different oxidation states has been studied. The substituting atom always occupies the 4(f) position and it is coordinated by 6 (+3) atoms. (orig.)

Additional details

Publishing Information

Journal Title
Materials Science Forum
Journal Volume
325-326
Journal Page Range
p. 17-20
ISSN
0255-5476
CODEN
MSFOEP

Conference

Title
2. International symposium on nitrides
Dates
9-11 Jun 1998
Place
Limerick (Ireland)

INIS

Country of Publication
Switzerland
Country of Input or Organization
Switzerland
INIS RN
31018561
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BOND LENGTHS; CHEMISTRY; CRYSTAL STRUCTURE; CRYSTALS; LANTHANUM COMPOUNDS; LATTICE PARAMETERS; SILICON COMPOUNDS; SYNTHESIS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; LENGTH; RARE EARTH COMPOUNDS; SCATTERING

Optional Information

Notes
9 refs.