Published February 15, 2012 | Version v1
Journal article

Investigation of the EPR g factors and defect structure for the Cu2+-VNa center in the X-irradiated NaCl: Cu+ crystal

  • 1. School of Physics and Electronic Engineering, Mianyang Normal University, Mianyang, Sichuan 621000 (China) and Research Center of Laser Fusion, CAEP, Mianyang 621000 (China)
  • 2. Department of Material Science, Sichuan University, Chengdu 610064 (China) and International Centre for Materials Physics, Chinese Academy of Sciences, Shenyang 110016 (China)
  • 3. Department of Material Science, Sichuan University, Chengdu 610064 (China)

Description

The g factors of a tetragonally-compressed Cu2+ center in NaCl: Cu+ crystal X-irradiated at room temperature are calculated from the high-order perturbation formulas based on the two-mechanism model. In the model, the contribution to g factors from both crystal-field (CF) and charge-transfer (CT) mechanisms are included. The calculations are based on the defect model that the tetragonally-compressed Cu2+center is assigned to the Cu2+ ion (which is caused by Cu+ ion (at the Na+ site) irradiated by X-ray) associated with a nearest Na+ ion vacancy VNa along C4 axis due to charge compensation. From the calculations, the g factors g|| and g⊥ are explained and the defect structure (charactering by the displacement ΔZ of the Cl- ion intervening in Cu2+ and VNa) of the Cu2+ (or Cu2+-VNa) center is obtained. The results are discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physb.2011.12.004

Additional details

Identifiers

DOI
10.1016/j.physb.2011.12.004;
PII
S0921-4526(11)01186-0;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
407
Journal Issue
4
Journal Page Range
p. 681-683
ISSN
0921-4526
CODEN
PHYBE3

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.