Published May 1, 2009 | Version v1
Journal article

Radiation tolerance of fluorite-structured oxides subjected to swift heavy ion irradiation

  • 1. Centre de Spectrometrie Nucleaire et de Spectrometrie de Masse, CNRS-IN2P3-Universite Paris-Sud, Batiments 104-108, 91405 Orsay Campus (France)
  • 2. Laboratoire d'Etude des Materiaux Hors Equilibre, Institut de Chimie Moleculaire et des Materiaux d'Orsay, Universite Paris-Sud, Batiment 410, 91405 Orsay Cedex (France)

Description

Fluorite-structured materials are known to exhibit an excellent structural stability under irradiation. The radiation stability of urania and yttria-stabilised cubic zirconia single crystals submitted to intense electronic excitations induced by 944-MeV Pb53+ ions was investigated. Various analytical tools (TEM, AFM, RBS/C, XRD) were employed to examine the modifications induced at the surface and in the crystal bulk. At low fluence irradiation leads to the formation of localised ion tracks whose centre is hollowed in the surface region over a depth of ∼100 nm and to the formation of nanometer-sized hillocks. Both features are interpreted as resulting from an ejection of matter in the wake of the projectile. Track overlapping at high fluence results in the formation of micrometer-sized domains (∼50 nm) in the crystal bulk characterised by a slight disorientation (∼0.2 deg.) with respect to the main crystallographic orientation of the crystal.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2009.01.070

Additional details

Identifiers

DOI
10.1016/j.nimb.2009.01.070;
PII
S0168-583X(09)00109-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
267
Journal Issue
8-9
Journal Page Range
p. 1451-1455
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international conference on ion beam modification of materials
Dates
31 Aug - 5 Sep 2008
Place
Dresden (Germany)

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.