Magnetic properties of TbFe2 particles prepared by magnetic field assisted ball milling
Description
The alloy of TbFe2 was studied by ball milling with and without the presence of external magnetic field. While the structure and powder morphology of the alloy were investigated using scanning electron microscope and X-ray diffraction, the magnetization was investigated using vibrating sample and superconducting quantum interference device magnetometers. The rate of particle reduction with ball milling is comparatively higher in the presence of external magnetic field than without it. Consequently, owing to a large fraction of particles acquiring near single domain configuration under the field assisted milling condition, the coercivity derived from these particles are as high as 6500 Oe than that of particles obtained without the aid of external magnetic field which is around 3850 Oe. The field cooled low temperature magnetization exhibits a large coercivity and skew in the shape of the magnetization curve due to the large anisotropy. - Highlights: • Magnetic field assisted milling aids particle size reduction considerably. • Μagnetic field assisted milled samples exhibit a remarkable improvement in coercivity. • Εffect of agglomerations of particles on coercivity was studied
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jmmm.2013.04.088Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2013.04.088;
- PII
- S0304-8853(13)00318-1;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 343
- Journal Page Range
- p. 144-148
- ISSN
- 0304-8853
- CODEN
- JMMMDC
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45106165
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AGGLOMERATION; ALLOYS; ANISOTROPY; COERCIVE FORCE; LAVES PHASES; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MAGNETIZATION; MILLING; PARTICLE SIZE; PARTICLES; SCANNING ELECTRON MICROSCOPY; SQUID DEVICES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; FLUXMETERS; MACHINING; MEASURING INSTRUMENTS; MICROSCOPY; MICROWAVE EQUIPMENT; PHYSICAL PROPERTIES; SCATTERING; SIZE; SUPERCONDUCTING DEVICES
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.