Modern state of neutron activation analysis of semiconductor silicon

The state of neutron activation methods for the analysis of silicon and their status among non-activation techniques are discussed. The role of semiconductor gamma-spectrometry in the development of instrumental methods is shown. The perspectives of the methods are described in these of a nuclear reactor with a high neutron flux density and sophisticated instrumentation. Problems of the control and removal of surface contaminants in the activation analysis of high-purity silicon are discussed