Published May 2021
| Version v1
Journal article
Non-thermal liquid-to-solid Si conversion induced by electron beam irradiation
- 1. Japan Advanced Institute of Science and Technology (JAIST), School of Materials Science, Nomi, Ishikawa (Japan)
- 2. Japan Advanced Institute of Science and Technology (JAIST), Center for Nano Materials and Technology (CNMT), Nomi, Ishikawa (Japan)
Description
A liquid precursor for the semiconductor, Si, called liquid Si (liq-Si), was synthesized. Although liq-Si is converted to semiconducting Si by heating at 400 °C, herein, we demonstrate liquid-to-solid Si conversion without heating using liquid-phase electron beam-induced deposition. This technique realizes the direct deposition of semiconducting Si by irradiating liq-Si with an electron beam. Specifically, at electron beam (diameter, ∼50 nm) irradiation, a Si deposit with a diameter of approximately 240 nm was obtained. It is expected that the application of this developed method will enable the production of high-resolution Si nanostructures and grant access to previously inaccessible devices. (author)
Availability note (English)
Available from DOI: https://doi.org/10.35848/1347-4065/abd9ceAdditional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics (Online)
- Journal Volume
- 60
- Journal Issue
- SB
- Journal Page Range
- p. SBBM03.1-SBBM03.5
- ISSN
- 1347-4065
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53074168
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AMORPHOUS STATE; CHEMICAL COMPOSITION; CYCLOPENTADIENE; DEHYDROGENATION; ELECTRON BEAMS; ENERGY BEAM DEPOSITION; IRRADIATION; NANOSTRUCTURES; PRECURSOR; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SILANES; SILICON; SYNTHESIS; THRESHOLD DOSE; TRANSMISSION ELECTRON MICROSCOPY; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKENES; BEAMS; CHEMICAL REACTIONS; CYCLOALKENES; DEPOSITION; DIENES; DOSES; ELECTRON MICROSCOPY; ELEMENTS; HYDRIDES; HYDROCARBONS; HYDROGEN COMPOUNDS; LEPTON BEAMS; MATERIALS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; PARTICLE BEAMS; POLYENES; RADIATION DOSES; SEMIMETALS; SILICON COMPOUNDS; SPECTROSCOPY; SURFACE COATING
Optional Information
- Notes
- 34 refs., 6 figs.