Published October 15, 1991 | Version v1
Journal article

Large strains in the epitaxy of Cu on Pt{001}

  • 1. College of Engineering and Applied Science, State University of New York, Stony Brook, New York (USA)
  • 2. IBM Research Center, P. O. Box 218, Yorktown Heights, New York (USA)

Description

Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 15--17 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001}1x1 net (a0=3.93 A), and that the bulk interlayer spacing is 1.62±0.04 A. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd{001}

Additional details

Publishing Information

Journal Title
Physical Review, B: Condensed Matter
Journal Volume
44
Journal Issue
15
Series
Phys. Rev., B: Condens. Matter.
Journal Page Range
8261-8266
ISSN
0163-1829
CODEN
PRBMD

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
23010381
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
COPPER; ELECTRON DIFFRACTION; GROWTH; LATTICE PARAMETERS; STRAINS; THIN FILMS
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; METALS; SCATTERING; TRANSITION ELEMENTS