Published October 15, 1991
| Version v1
Journal article
Large strains in the epitaxy of Cu on Pt{001}
- 1. College of Engineering and Applied Science, State University of New York, Stony Brook, New York (USA)
- 2. IBM Research Center, P. O. Box 218, Yorktown Heights, New York (USA)
Description
Epitaxial pseudomorphic films of Cu have been grown on Pt{001} to thicknesses of 15--17 layers. A quantitative low-energy electron-diffraction intensity analysis of a ten-layer film reveals that the in-plane lattice constant is that of the Pt{001}1x1 net (a0=3.93 A), and that the bulk interlayer spacing is 1.62±0.04 A. Strain analysis shows that this structure is derived from the fcc structure of Cu with a plane strain of about 9%, similar to Cu films grown on Pd{001}
Additional details
Publishing Information
- Journal Title
- Physical Review, B: Condensed Matter
- Journal Volume
- 44
- Journal Issue
- 15
- Series
- Phys. Rev., B: Condens. Matter.
- Journal Page Range
- 8261-8266
- ISSN
- 0163-1829
- CODEN
- PRBMD
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23010381
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COPPER; ELECTRON DIFFRACTION; GROWTH; LATTICE PARAMETERS; STRAINS; THIN FILMS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; FILMS; METALS; SCATTERING; TRANSITION ELEMENTS