Published March 15, 2004 | Version v1
Journal article

Comparative study of soft x-ray emission characteristics in a low energy dense plasma focus device

  • 1. Applied Physics Section, Bhabha Atomic Research Centre, Mumbai-400 085 (India)
  • 2. Centre of Plasma Physics, Dispur, Guwahati-781 006 (India)

Description

An investigation on the soft x rays emitted in a 2.2 kJ Mather-type dense plasma focus device using a multichannel diode spectrometer and a simple pinhole camera is reported. Emitted x rays associated with different shapes (hollow, solid, and hemispherical) of anode and in hydrogen/nitrogen gas medium are compared. The structure of x-ray emitting sites as well as x-ray yields were found to be strongly influenced by the shape of the anode and the filling gas pressure. The maximum yield of 2.2 J into 4π sr was obtained in the case of hemispherical anode in hydrogen gas medium. The x-ray pinhole images of the collapsed plasma with the hemispherical anode indicated spot-like structure having 500-800 μm in diameter. On the contrary, other anode shapes showed columnar pinched structure of 8-10 mm in length and 1-2 mm in diameter. Results indicated that an appropriate design of the anode could enhance the x-ray yield by more than tenfold in a conventional low energy dense plasma focus device

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
95
Journal Issue
6
Journal Page Range
p. 2975-2981
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
(c) 2004 American Institute of Physics.