Published May 2007
| Version v1
Journal article
Research on the single event latchup in the space and it's protection technology
Description
This paper presents the string elements for Single Event Latchup, and discusses the major characters and test method for Single Event Latchup of CMOS devices. In the experiment of Latchup, we accomplish the Latchup test for several CMOS devices. On the basis of test, we develop the Latchup protection circuit successfully, which could automatically detect and promptly relieve the Latchup state. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Electronics and Detection Technology
- Journal Volume
- 27
- Journal Issue
- 3
- Journal Page Range
- p. 567-570
- ISSN
- 0258-0934
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 39116999
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- COSMIC RADIATION; EQUIPMENT PROTECTION DEVICES; MOS TRANSISTORS; PHYSICAL RADIATION EFFECTS; SIMULATION; SINGLE-PARTICLE MODES; SPACE; TESTING
- Descriptors DEC
- IONIZING RADIATIONS; OSCILLATION MODES; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Notes
- 5 figs., 1 tab., 5 refs.