Published 1994
| Version v1
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Forecasting the ionization response of CMIS IC analog switches with insulation by dielectric pockets
Creators
Description
A new approach to estimation and forecasting the stability indices of analog switches with insulation by dielectric pockets on the basis of calculational-experimental simulation and laser imitation tests is proposed. The models with concentrated elements are developed for description of nonmonotonous character of the CMIS transistor parameter dependences on the dose rate under pulse ionizing irradiation
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29003612.pdf
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Additional details
Additional titles
- Original title (Russian)
- Прогнозирование ионизационной реакции KMDP IS аналоговых ключей с изоляцией диэлектрическими карманами
Publishing Information
- Publisher
- TsNII Upravleniya, Ehkonomiki i Informatsii.
- Imprint Place
- Moscow (Russian Federation)
- Imprint Title
- Problems of nuclear science and engineering. Scientific-technical collection
- Imprint Pagination
- 142 p.
- Journal Issue
- no.1-2
- Series
- Fizika radiatsionnogo vozdejstviya na radioehlektronnuyu apparaturu.
- Journal Page Range
- p. 22-31.
- Report number
- INIS-RU--431
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 29003612
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- EQUIVALENT CIRCUITS; FLOWSHEETS; FORECASTING; INTEGRATED CIRCUITS; IONIZING RADIATIONS; LEAKAGE CURRENT; MIS TRANSISTORS; PERFORMANCE TESTING; PHYSICAL RADIATION EFFECTS; RADIATION DOSES; RELIABILITY; SERVICE LIFE; SIMULATION; TRANSISTOR SWITCHING CIRCUITS
- Descriptors DEC
- CURRENTS; DIAGRAMS; ELECTRIC CURRENTS; ELECTRONIC CIRCUITS; INFORMATION; LIFETIME; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; SWITCHING CIRCUITS; TESTING; TRANSISTORS
Optional Information
- Notes
- 6 refs., 6 figs. Imprint:Voprosy atomnoj nauki i tekhniki. Nauchno-tekhnicheskij sbornik.