Published 2001 | Version v1
Journal article

High precision mass spectroscopy using highly charged ions in a Penning trap

  • 1. CEA Saclay, Gif-sur-Yvette (France). Lab. National Henri Becquerel
  • 2. Stockholm Univ. (Sweden). Atomic Physics
  • 3. Manne Siegbahn Inst. of Physics, Stockholm (Sweden)

Description

High precision mass measurements are performed at the SMILETRAP facility by measuring the cyclotron frequencies of ions trapped in the electric and magnetic fields of a Penning trap. Since the resolving power increases linearly with the ion charge state, the SMILETRAP experiment is connected to an electron beam ion source (EBIS). Using this technique we have shown that we are able to measure routinely the mass of any stable element within 1 ppb accuracy. Examples of some of the recent mass measurements and their possible applications for various fields of atomic and nuclear physics are given. (orig.)

Additional details

Publishing Information

Journal Title
Physica Scripta. T
Journal Volume
92
Journal Page Range
p. 99-101
ISSN
0281-1847

Conference

Title
10. international conference on the physics of highly charged ions
Acronym
HCI 2000
Dates
30 Jul - 3 Aug 2000
Place
Berkeley, CA (United States)