Published March 2009 | Version v1
Journal article

Lifetime and transition probability determination in Xe IX

  • 1. Institut de Physique Nucleaire, Atomique et Spectroscopie, Universite de Liege, Sart Tilman B15, B-4000 Liege (Belgium)
  • 2. CEPAMOQ, Faculty of Sciences, University of Douala, PO Box 8580 Douala (Cameroon)
  • 3. Astrophysique et Spectroscopie, Universite de Mons-Hainaut, B-7000 Mons (Belgium)

Description

A new set of transition probabilities is proposed for Xe IX. They have been calculated by two different theoretical approaches i.e. a fully relativistic multiconfiguration Dirac-Fock (MCDF) method and a partly relativistic Hartree-Fock (HFR) approach taking core-polarization effects into account. Their accuracy has been evaluated through comparisons with lifetime measurements for 11 levels performed using beams of Xe+ ions produced by a 2 MV Van de Graaff accelerator. The agreement theory-experiment is nice for most of the levels and gives more weight to the theoretical models used for the calculations and, consequently, to the new transition probabilities

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jqsrt.2008.11.007

Additional details

Identifiers

DOI
10.1016/j.jqsrt.2008.11.007;
PII
S0022-4073(08)00240-9;

Publishing Information

Journal Title
Journal of Quantitative Spectroscopy and Radiative Transfer
Journal Volume
110
Journal Issue
4-5
Journal Page Range
p. 284-292
ISSN
0022-4073
CODEN
JQSRAE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40043604
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
COMPARATIVE EVALUATIONS; FOILS; HARTREE-FOCK METHOD; LIFETIME; POLARIZATION; PROBABILITY; RELATIVISTIC RANGE; VAN DE GRAAFF ACCELERATORS; XENON IONS
Descriptors DEC
ACCELERATORS; APPROXIMATIONS; CALCULATION METHODS; CHARGED PARTICLES; ELECTROSTATIC ACCELERATORS; ENERGY RANGE; EVALUATION; IONS

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.