Growth and magnetic property of ζ-phase Mn2N1±x thin films by plasma-assisted molecular beam epitaxy
Creators
- 1. State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 510275 (China)
- 2. School of Science, Guilin University of Technology, Guilin 541004 (China)
Description
ζ-phase manganese nitride films were directly grown on sapphire substrates using plasma-assisted molecular beam epitaxy. Mn2N1.06, Mn2N0.98, and Mn2N0.86 films were synthesized by controlling the temperature of the effusion cell filled with highly pure manganese powder. The composition, structure, and morphology of the films were identified by x-ray photoelectron spectroscopy, x-ray diffraction and atomic force microscopy, and the magnetic properties of the films were characterized by a superconducting quantum interference device magnetometer at 5 and 300 K. The magnetic measurements reveal that Mn2N1±x exhibits weak ferromagnetism at 5 K, which is mainly ascribed to the weak interaction among the Mn cations induced by the nitrogen vacancies. Furthermore, the Mn2N0.86 single-crystalline films are found to have room-temperature ferromagnetism, which is attributed to the strain of the Mn2N0.86 films raised from lattice mismatch between the Mn2N0.86 films and the substrates.
Additional details
Identifiers
- DOI
- 10.1063/1.3386516;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 107
- Journal Issue
- 10
- Journal Page Range
- p. 103914-103914.5
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42069701
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; DEPOSITION; DIFFUSION; FERROMAGNETIC MATERIALS; FERROMAGNETISM; MAGNETIC PROPERTIES; MANGANESE NITRIDES; MOLECULAR BEAM EPITAXY; MONOCRYSTALS; PLASMA; SEMICONDUCTOR MATERIALS; SQUID DEVICES; SUBSTRATES; TEMPERATURE DEPENDENCE; THIN FILMS; VACANCIES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; EPITAXY; EQUIPMENT; FILMS; FLUXMETERS; MAGNETIC MATERIALS; MAGNETISM; MANGANESE COMPOUNDS; MATERIALS; MEASURING INSTRUMENTS; MICROSCOPY; MICROWAVE EQUIPMENT; NITRIDES; NITROGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; PNICTIDES; POINT DEFECTS; SCATTERING; SPECTROSCOPY; SUPERCONDUCTING DEVICES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2010 American Institute of Physics