Published March 1986
| Version v1
Journal article
Computerized imaging system for field ion microscopy
- 1. Max-Planck-Gesellschaft, Berlin (Germany, FR). Fritz-Haber Institut
Description
A position sensitive detector is used to accumulate field ion images directly from the two dimensional density distribution of the imaging ions. The capabilities of this new system will be demonstrated with field evaporation and in a gated time of flight experiment with nanosecond resolution
Additional details
Publishing Information
- Journal Title
- J. Phys. (Les Ulis), Colloq.
- Journal Volume
- 47
- Journal Issue
- C2
- Series
- J. Phys. (Les Ulis), Colloq.
- Journal Page Range
- 479-484
- ISSN
- 0449-1947
- CODEN
- JPQCA
Conference
- Title
- 32. International field emission symposium.
- Dates
- 14-19 Jul 1986.
- Place
- Wheeling, WV (USA).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 18028928
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- IMAGE PROCESSING; ION MICROSCOPY; MULTI-CHANNEL ANALYZERS; POSITION SENSITIVE DETECTORS
- Descriptors DEC
- ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS; MICROSCOPY; PULSE ANALYZERS; RADIATION DETECTORS