Published August 1, 1976 | Version v1
Journal article Metadata-only

Current-phase relations as determinants of superconducting thin-film weak-link I-V characteristics

Creators

  • 1. Bell Telephone Laboratories, Holmdel, New Jersey 17733

Description

The dc I-V characteristics of superconducting thin-film Sn-Au proximity bridges and uniform-thickness Sn microbridges have been carefully analyzed as a function of the directly measured current-phase relation (CPR). At sufficiently low dc current and voltage levels where heating and relaxation time effects are not important, the I-V characteristics are very well described by a shunted weak-link model that includes the proper dc CPR and a shunt resistance

Additional details

Identifiers

DOI
10.1063/1.88998;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
29
Journal Issue
3
Series
Appl. Phys. Lett.
Journal Page Range
214-216
ISSN
0003-6951

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
8281535
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S36: MATERIALS SCIENCE;
Descriptors DEI
CRITICAL CURRENT; ELECTRIC BRIDGES; ELECTRICAL PROPERTIES; FILMS; GOLD; SUPERCONDUCTING JUNCTIONS; SUPERCONDUCTORS; TIN; TRANSITION TEMPERATURE; TUNNEL EFFECT
Descriptors DEC
CURRENTS; ELECTRIC CURRENTS; ELECTRICAL EQUIPMENT; ELEMENTS; METALS; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS

Optional Information

Notes
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