Analysis and modeling of resistive switching mechanisms oriented to resistive random-access memory
Creators
- 1. State Key Laboratory of High Performance Computing, National University of Defense Technology, Changsha 410073 (China)
- 2. School of Computer, National University of Defense Technology, Changsha 410073 (China)
Description
With the progress of the semiconductor industry, the resistive random-access memory (RAM) has drawn increasing attention. The discovery of the memristor has brought much attention to this study. Research has focused on the resistive switching characteristics of different materials and the analysis of resistive switching mechanisms. We discuss the resistive switching mechanisms of different materials in this paper and analyze the differences of those mechanisms from the view point of circuitry to establish their respective circuit models. Finally, simulations are presented. We give the prospect of using different materials in resistive RAM on account of their resistive switching mechanisms, which are applied to explain their resistive switchings
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/22/3/038401Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 22
- Journal Issue
- 3
- Journal Page Range
- [6 p.]
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45032271
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC CONDUCTIVITY; MATHEMATICAL MODELS; RANDOMNESS; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR STORAGE DEVICES
- Descriptors DEC
- ELECTRICAL PROPERTIES; MATERIALS; MEMORY DEVICES; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES