Published March 2013 | Version v1
Journal article

Analysis and modeling of resistive switching mechanisms oriented to resistive random-access memory

  • 1. State Key Laboratory of High Performance Computing, National University of Defense Technology, Changsha 410073 (China)
  • 2. School of Computer, National University of Defense Technology, Changsha 410073 (China)

Description

With the progress of the semiconductor industry, the resistive random-access memory (RAM) has drawn increasing attention. The discovery of the memristor has brought much attention to this study. Research has focused on the resistive switching characteristics of different materials and the analysis of resistive switching mechanisms. We discuss the resistive switching mechanisms of different materials in this paper and analyze the differences of those mechanisms from the view point of circuitry to establish their respective circuit models. Finally, simulations are presented. We give the prospect of using different materials in resistive RAM on account of their resistive switching mechanisms, which are applied to explain their resistive switchings

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/22/3/038401

Additional details

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
22
Journal Issue
3
Journal Page Range
[6 p.]
ISSN
1674-1056

INIS

Country of Publication
China
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45032271
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ELECTRIC CONDUCTIVITY; MATHEMATICAL MODELS; RANDOMNESS; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR STORAGE DEVICES
Descriptors DEC
ELECTRICAL PROPERTIES; MATERIALS; MEMORY DEVICES; PHYSICAL PROPERTIES; SEMICONDUCTOR DEVICES