Published 2017 | Version v1
Miscellaneous Metadata-only

Thickness dependence of the charge density wave order parameter in thin exfoliated 1T-VSe2

Creators

  • 1. DQMP, University of Geneva (Switzerland)

Description

no abstract available

Part of:
Joint Annual Meeting of the Swiss Physical Society and the Austrian Physical Society

Additional details

Additional titles

Original title (English)
Gemeinsame Jahrestagung von SPG und ÖPG

Identifiers

URL
http://www.sps.ch/events/gemeinsame-jahrestagung-2017/;

Publishing Information

Publisher
Swiss Physical Society
Imprint Place
Basel (Switzerland)
Imprint Title
Joint Annual Meeting of the Swiss Physical Society and the Austrian Physical Society
Imprint Pagination
129 p.
Journal Page Range
p. 106

Conference

Title
Joint Annual Meeting of the Swiss Physical Society and the Austrian Physical Society
Original Conference Title
Gemeinsame Jahrestagung von SPG und ÖPG
Dates
21-25 Aug 2017
Place
Geneve (Switzerland)

INIS

Country of Publication
Switzerland
Country of Input or Organization
Austria
INIS RN
49052729
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
CHARGE DENSITY; FERMI LEVEL; GROUND STATES; ORDER PARAMETERS; SCANNING TUNNELING MICROSCOPY; SPACE CHARGE; TEMPERATURE DEPENDENCE; THICKNESS; TRANSITION TEMPERATURE; VANADIUM SELENIDES
Descriptors DEC
CHALCOGENIDES; DIMENSIONLESS NUMBERS; DIMENSIONS; ENERGY LEVELS; MICROSCOPY; PHYSICAL PROPERTIES; SELENIDES; SELENIUM COMPOUNDS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; VANADIUM COMPOUNDS

Optional Information

Notes
Imprint:Gemeinsame Jahrestagung von SPG und #Latin Capital Letter O With Diaeresis#PG