Published 2016
| Version v1
Journal article
Quality assurance in the production of a new silicon strip detector for the ATLAS experiment
- 1. DESY, Zeuthen (Germany)
- 2. Institute of High Energy Physics, Beijing (China)
- 3. Humboldt-Universitaet zu Berlin (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Qualitaetssicherung in der Produktion eines neuen Silizium-Streifendetektors fuer das ATLAS-Experiment
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Hamburg 2016 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 51(2)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG-Fruehjahrstagung 2016 (Spring meeting) of the section matter and cosmos (SMuK) together with the divisions gravity and relativity, radiation and medical physics, particle physics, theoretical and mathematical physics, and the working group philosophy of physics
- Original Conference Title
- DPG-Fruehjahrstagung 2016 der Sektion Materie und Kosmos (SMuK) gemeinsam mit den Fachverbaenden Gravitation und Relativitaetstheorie, Strahlen- und Medizinphysik, Teilchenphysik, Theoretische und Mathematische Grundlagen der Physik sowie der Arbeitsgruppe Philosophie der Physik
- Dates
- 29 Feb - 4 Mar 2016
- Place
- Hamburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 48010348
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- AUTOMATION; BONDING; CERN LHC; INTEGRATED CIRCUITS; MODULAR STRUCTURES; POWER SUPPLIES; PRODUCTION; QUALITY ASSURANCE; READOUT SYSTEMS; SI MICROSTRIP DETECTORS; THICKNESS
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; DIMENSIONS; ELECTRONIC CIRCUITS; ELECTRONIC EQUIPMENT; EQUIPMENT; FABRICATION; JOINING; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; STORAGE RINGS; SYNCHROTRONS
Optional Information
- Notes
- Session: T 10.1 Mo 11:00