Published December 1998 | Version v1
Journal article Metadata-only

CEMS of nitride coatings in agressive environments

Creators

  • 1. University of Ljubljana, J. Stefan Institute (Slovenia)
  • 2. Instituto de Quimica-Fisica 'Rocasolano', CSIC (Spain)
  • 3. Eoetvoes University, Department of Physical Chemistry (Hungary)

Description

The corrosion properties of single layered TiN and CrN films have been compared to bi-layered and multi-layered Ti/TiN films. XPS has showed that in humid SO2 atmosphere the best corrosion properties have been achieved by a multi-layered Ti/TiN coating. Cyclic voltammetry in acetate buffer has been applied to measure the porousity and corrosion resistance of coatings. The best results have been achieved by multi-layered Ti/TiN and CrN films. Conversion electron Moessbauer spectroscopy has been used to study the changes in the interface Fe/TiN during thermal treatment in UHV. It has been shown that the amount of iron nitrides in the interface increases with increasing temperature

Additional details

Identifiers

DOI
10.1023/A:1012633129107;

Publishing Information

Journal Title
Hyperfine Interactions
Journal Volume
111
Journal Issue
1-4
Journal Page Range
p. 93-100
ISSN
0304-3843
CODEN
HYINDN

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40055835
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATMOSPHERES; AUGMENTATION; CHROMIUM NITRIDES; COATINGS; CORROSION; CORROSION RESISTANCE; ELECTRONS; FILMS; HEAT TREATMENTS; IRON NITRIDES; MOESSBAUER EFFECT; SULFUR DIOXIDE; TIN; TITANIUM NITRIDES; X-RAY PHOTOELECTRON SPECTROSCOPY
Descriptors DEC
CHALCOGENIDES; CHEMICAL REACTIONS; CHROMIUM COMPOUNDS; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; IRON COMPOUNDS; LEPTONS; METALS; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PNICTIDES; SPECTROSCOPY; SULFUR COMPOUNDS; SULFUR OXIDES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Copyright
Copyright (c) 1998 Kluwer Academic Publishers