Published May 28, 2014 | Version v1
Journal article

Negative differential resistance and resistance switching behaviors in BaTiO3 thin films

  • 1. Key Laboratory of Photovoltaic Materials of Henan Province and School of Physics and Electronics, Henan University, Kaifeng 475004 (China)
  • 2. Key Laboratory of Semiconductor Materials, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083 (China)

Description

The polycrystalline BaTiO3 (BTO) thin films were grown on F-doped SnO2 substrates by pulsed laser deposition. The devices show a rectification at a small voltage, while bipolar resistive switching (RS) and negative differential resistance (NDR) appear at a large voltage. Furthermore, RS remains and NDR disappears when no positive bias is applied, while both RS and NDR behaviors improve when increasing the positive bias. The electrons trapped/detrapped by interface states at Au/BTO interface are proposed to understand the above behaviors.

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
115
Journal Issue
20
Journal Page Range
p. 204515-204515.4
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
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