Published May 1, 2016
| Version v1
Journal article
Synthesis and characterization of chemically deposited CdS thin films without toxic precursors
Creators
- 1. Departamento de Fśica, Facultad de Ciencias, Universidad del Bío-Bío, Collao 1202, Casilla 5-C, Concepción (Chile)
- 2. Departamento de Física, Facultad de Ciencias Físicas y Matemáticas, Universidad de Concepción, Casilla 160-C, Concepción (Chile)
Description
Al doped and undoped CdS thin films (CdS:Al) were deposited on glass, copper and bronze substrates by chemical bath deposition technique in an ammonia-free cadmium-sodium citrate system. The structural and optical properties of the CdS films were determined by X-ray diffraction (XRD), scanning electron microscope (SEM), and simultaneous transmission- reflection spectroscopy. It was found that the properties of the films depend on the amount of Al in the growth solutions and deposition time. The increase in Al content in the reaction solution led to a smaller crystallite size and higher energy band gap that varies in the range 2.42 eV - 2.59 eV depending on the Al content. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/720/1/012029Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 720
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1742-6596
Conference
- Title
- 19. Chilean physics symposium
- Dates
- 26-28 Nov 2014
- Place
- Concepcion (Chile)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49068532
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM ADDITIONS; BRONZE; CADMIUM SULFIDES; COPPER; DEPOSITION; DOPED MATERIALS; GLASS; OPTICAL PROPERTIES; PRECURSOR; REFLECTION; SCANNING ELECTRON MICROSCOPY; SODIUM; SUBSTRATES; SYNTHESIS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METALS; ALLOYS; ALUMINIUM ALLOYS; CADMIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; COPPER ALLOYS; COPPER BASE ALLOYS; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FILMS; INORGANIC PHOSPHORS; MATERIALS; METALS; MICROSCOPY; PHOSPHORS; PHYSICAL PROPERTIES; SCATTERING; SULFIDES; SULFUR COMPOUNDS; TIN ALLOYS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS