Published September 20, 2019
| Version v1
Journal article
Simultaneous growth of Ga2S3 and GaS thin films using physical vapor deposition with GaS powder as a single precursor
- 1. Department of Physics, Chung-Ang University, Seoul 06974 (Korea, Republic of)
- 2. Department of Physics and Integrative Research Center for Two-Dimensional Functional Materials, Chung-Ang University, Seoul 06974 (Korea, Republic of)
Description
High quality gallium sulfide II (GaS) and gallium sulfide III () thin films on /Si substrates were simultaneously grown by using physical vapor deposition with GaS powder as a single precursor. By controlling the substrate temperature, we can selectively grow either GaS or Ga2S3 thin films on SiO2/Si substrates. Relatively high and low substrate temperature conditions resulted in Ga2S3 and GaS thin films, respectively. The synthesized thin films were characterized by x-ray diffraction, Raman spectroscopy, field emission scanning electron microscopy, atomic force microscopy, and x-ray photoelectron spectroscopy analyses. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6528/ab284cAdditional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 30
- Journal Issue
- 38
- Journal Page Range
- [6 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51054203
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; FIELD EMISSION; GALLIUM SULFIDES; PHYSICAL VAPOR DEPOSITION; POWDERS; PRECURSOR; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON OXIDES; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; EMISSION; FILMS; GALLIUM COMPOUNDS; LASER SPECTROSCOPY; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; SURFACE COATING