Optical reflectance anisotropy of the growth of Fe monolayers on W(110)
Creators
- 1. Department of Physics and Surface Science Research Centre, University of Liverpool, Liverpool, L69 7ZE (United Kingdom)
- 2. Faculty of Science and Arts, Department of Physics, Balikesir University, 18.km Cagis Campus, 10145 Balikesir (Turkey)
Description
We report measurements of the optical anisotropy of Fe layers grown on the W(110) surface using reflection anisotropy spectroscopy (RAS). As the first monolayer of Fe is deposited onto W(110), the resonance-like RAS profile of the clean surface is reduced in intensity. We find evidence for the surface state on W(110) surviving as an interface state following Fe deposition. We observe an anisotropic optical response from Fe layers grown on top of the first two monolayers, where a broad peak at 3 eV dominates the RAS response. The results are simulated in terms of a layered Fresnel reflection model incorporating either a strained Fe overlayer or an Fe overlayer whose dielectric properties are approximated by a simple Lorentzian oscillator. Both approaches are found to produce simulated RA spectra that are in good agreement with experiment. The former approach provides evidence that RAS can detect anisotropy in strained overlayers and that 7 ML films have bulk-like electronic and optical properties.
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-8984/23/35/355002Additional details
Identifiers
- DOI
- 10.1088/0953-8984/23/35/355002;
- PII
- S0953-8984(11)94327-6;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 23
- Journal Issue
- 35
- Journal Page Range
- [7 p.]
- ISSN
- 0953-8984
- CODEN
- JCOMEL
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43010115
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANISOTROPY; DEPOSITION; DIELECTRIC PROPERTIES; FILMS; INTERFACES; IRON; LAYERS; OPTICAL PROPERTIES; OSCILLATORS; REFLECTION; RESONANCE; SIMULATION; SPECTRA; SPECTROSCOPY; SUBSTRATES; SURFACES; TUNGSTEN
- Descriptors DEC
- ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; TRANSITION ELEMENTS