Curious resistivity behaviour of vacuum evaporated Er, Dy and Gd films

The thickness dependence of electrical resistivity of Er, Dy and Gd thin films at room temperature has been studied. The electrical resistivity of these films does not show the usual behaviour expected on the basis of the size affected conduction i.e. Fuchs Sondheimer theory, which always leads to an increase in the resistivity with decreasing film thickness. Instead, the observed resistivity behaviour is characterised mainly by (i) a decrease in resistivity with decreasing film thickness (between 1600-1000 deg A) for Er films and below about 500 deg A for Gd and Dy films), (ii) a thickness independent resistivity behaviour for Er films from 1000-600 deg A, (iii) increase in resistivity of Er films in the thickness region 600-200 deg A, (iv) the resistivity values in certain thickness regions, which are even less than the corresponding bulk value. Analysis reveals that those curious rho-t characteristics arise due to three effects namely, the increase resistivity due to surface scattering the suppression of resistivity due to thickness dependence of structural phase and spin disorder scattering. All the effects are dominant in thickness regions, different in different metals giving rise to the observed characteristics. (author)