Published May 11, 2015 | Version v1
Journal article

Radiation hardness of three-dimensional polycrystalline diamond detectors

  • 1. Department of Physics and Astronomy, University of Florence, Via G. Sansone 1, 50019 Sesto Fiorentino (Italy)
  • 2. National Institute of Nuclear Physics (INFN), Via B. Rossi, 1-3, 50019 Sesto Fiorentino (Italy)
  • 3. Istituto Nazionale di Ottica (INO-CNR), Largo Enrico Fermi 6, 50125 Firenze (Italy)
  • 4. European Laboratory for Non-Linear Spectroscopy, Via Nello Carrara 1, 50019 Sesto Fiorentino (Italy)
  • 5. Jozef Stefan Institute, Jamova cesta 39, 1000 Ljubljana (Slovenia)
  • 6. Department of Physics, University of Perugia, Via A. Pascoli, 06123 Perugia (Italy)
  • 7. National Institute of Nuclear Physics (INFN), Via A. Pascoli, 06123 Perugia (Italy)
  • 8. Department of Engineering, University of Perugia, Via G. Duranti 93, 06125 Perugia (Italy)
  • 9. GSI Helmholtzzentrum für Schwerionenforschung, Planckstraße 1, 64291 Darmstadt (Germany)

Description

The three-dimensional concept in particle detection is based on the fabrication of columnar electrodes perpendicular to the surface of a solid state radiation sensor. It permits to improve the radiation resistance characteristics of a material by lowering the necessary bias voltage and shortening the charge carrier path inside the material. If applied to a long-recognized exceptionally radiation-hard material like diamond, this concept promises to pave the way to the realization of detectors of unprecedented performances. We fabricated conventional and three-dimensional polycrystalline diamond detectors, and tested them before and after neutron damage up to 1.2 ×1016 cm−2, 1 MeV-equivalent neutron fluence. We found that the signal collected by the three-dimensional detectors is up to three times higher than that of the conventional planar ones, at the highest neutron damage ever experimented

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
106
Journal Issue
19
Journal Page Range
p. 193509-193509.5
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
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