Published November 30, 2015
| Version v1
Journal article
Ultrafast electron diffraction with megahertz MeV electron pulses from a superconducting radio-frequency photoinjector
Creators
- 1. Institute of Heavy Ion Physics and State Key Laboratory of Nuclear Physics and Technology, Peking University, Beijing 100871 (China)
- 2. IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240 (China)
- 3. Key Laboratory for Laser Plasmas (Ministry of Education), Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240 (China)
Description
We report ultrafast relativistic electron diffraction operating at the megahertz repetition rate where the electron beam is produced in a superconducting radio-frequency (rf) photoinjector. We show that the beam quality is sufficiently high to provide clear diffraction patterns from gold and aluminium samples. With the number of electrons, several orders of magnitude higher than that from a normal conducting photocathode rf gun, such high repetition rate ultrafast MeV electron diffraction may open up many new opportunities in ultrafast science
Additional details
Identifiers
- DOI
- 10.1063/1.4936192;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 107
- Journal Issue
- 22
- Journal Page Range
- p. 224101-224101.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47056155
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- ALUMINIUM; ELECTRON BEAMS; ELECTRON DIFFRACTION; ELECTRONS; GOLD; MEV RANGE; PHOTOCATHODES; PULSES; RADIOWAVE RADIATION; RELATIVISTIC RANGE
- Descriptors DEC
- BEAMS; CATHODES; COHERENT SCATTERING; DIFFRACTION; ELECTRODES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; LEPTON BEAMS; LEPTONS; METALS; PARTICLE BEAMS; RADIATIONS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC