Evolution mechanism of alumina coating layer on rutile TiO2 powders and the pigmentary properties
Creators
- 1. Faculty of Chemistry and Chemical Engineering, Jiangsu University, Xuefu Road 301, Zhenjiang, 212013 (China)
Description
The evolution of alumina coating layers on rutile TiO2 particle surfaces was investigated starting from aluminum sulfate by a chemical liquid deposition method. The morphology of the alumina coating layers was determined by transmission electron microscopy. The chemical structure and the evolution mechanism of the alumina coating layers on TiO2 surfaces were investigated by Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, and powder X-ray diffraction techniques. The dispersibility of the alumina-coated TiO2 powders was determined by dynamic laser scattering (DLS) mode. The alumina coating layers existed in boehmite phase, AlOOH, and anchored at the surfaces of TiO2 via Ti-O-Al bond. The formation of alumina coating layers on TiO2 surfaces depended on the pH value of the deposition solution and the alumina loading. After coated by alumina layer, the dispersibility, whiteness, brightness, and light scattering index of the resultant samples were promoted.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.04.013Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.04.013;
- PII
- S0169-4332(09)00387-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 16
- Journal Page Range
- p. 7427-7433
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44017583
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM OXIDES; ALUMINIUM SULFATES; DEPOSITION; FOURIER TRANSFORM SPECTROMETERS; LASER SPECTROSCOPY; LAYERS; LIGHT SCATTERING; LOADING; PARTICLES; PH VALUE; RUTILE; SURFACES; TITANIUM OXIDES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; MATERIALS; MATERIALS HANDLING; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIOACTIVE MATERIALS; RADIOACTIVE MINERALS; SCATTERING; SPECTROMETERS; SPECTROSCOPY; SULFATES; SULFUR COMPOUNDS; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.