Published August 25, 1980
| Version v1
Journal article
Structure of amorphous silicon and silicon hydrides
- 1. Solid State Science Division, Argonne National Laboratory, Argonne, Illinois 60439
Description
Neutron scattering measurements have been made on pure, hydrogenated, and deuterated samples of amorphous silicon (a-Si) in the wave-vector range 0.007-8,75 A-1. Small-angle data indicate structures in the samples of average radius of gyration as large as 270 A. Large-angle data show that for the concentrations we have measured (14%), the structure of a-Si is not altered by the incorporation of large amounts of H or D. The silicon-hydrogen and silicon-deuterium partial structure factors have also been obtained
Additional details
Publishing Information
- Journal Title
- Phys. Rev. Lett.
- Journal Volume
- 45
- Journal Issue
- 8
- Series
- Phys. Rev. Lett.
- Journal Page Range
- 648-652
- ISSN
- 0031-9007
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 12577411
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; COMPUTER CODES; DEUTERATION; ELASTIC SCATTERING; GLASS; HYDROGENATION; MAGNETRONS; MONTE CARLO METHOD; NEUTRON DIFFRACTION; SILANES; SILICON; SOLAR CELLS; SPUTTERING; SUBSTRATES
- Descriptors DEC
- CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; DIRECT ENERGY CONVERTERS; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; HYDRIDES; HYDROGEN COMPOUNDS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; SCATTERING; SEMIMETALS; SILICON COMPOUNDS