Published February 2003 | Version v1
Journal article Metadata-only

The imaging of chemical samples with a scanning near-field infrared microscope

Creators

  • 1. Chinese Academy of Sciences, Beijing (China). Inst. of High Energy Physics

Description

The imaging research of chemical samples by using a scanning near-field infrared microscope (SNIM) was described in the paper. And this microscope use Beijing Free Electron Laser as its illuminating light. From the SNIM image, we can make a precise decision about the sample composition and the percentage of each component in a 10 μm x 10 μm-102 μm x 102 μm region

Additional details

Publishing Information

Journal Title
Acta Physica Sinica
Journal Volume
52
Journal Issue
2
Journal Page Range
p. 298-301
ISSN
1000-3290

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
35020384
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CHEMICAL COMPOSITION; FREE ELECTRON LASERS; IMAGE PROCESSING; IMAGES; NEAR INFRARED RADIATION; OPTICAL MICROSCOPES; SCANNING LIGHT MICROSCOPY
Descriptors DEC
ELECTROMAGNETIC RADIATION; INFRARED RADIATION; LASERS; MICROSCOPES; MICROSCOPY; OPTICAL MICROSCOPY; PROCESSING; RADIATIONS