Published January 2008
| Version v1
Journal article
Temperature dependence of excitonic emission in cubic CdSe thin film
Creators
- 1. Department of Electrophysics, National Chiao Tung University, Hsin-Chu 30010, Taiwan (China)
- 2. Department of Physics, Chung Yuan Christian University, Chung-Li 32023, Taiwan (China)
- 3. Department of Electronic Engineering, Chung Yuan Christian University, Chung-Li 32023, Taiwan (China)
Description
A detailed photoluminescence investigation of the thermal redshift and broadening of the excitonic line of cubic CdSe film grown by molecular beam epitaxy is presented. Free excitonic emission from the cubic CdSe film was observed at low temperature. Temperature-dependent measurement was performed to obtain material parameters related to exciton-phonon interaction by fitting the experimental data to the phenomenological model. The relative contribution of both acoustic and optical phonon to the band gap shrinkage and exciton linewidth broadening are discussed. Exciton binding energy of 16±1.5 meV was determined from the Arrhenius analysis
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jlumin.2007.06.003Additional details
Identifiers
- DOI
- 10.1016/j.jlumin.2007.06.003;
- PII
- S0022-2313(07)00202-5;
Publishing Information
- Journal Title
- Journal of Luminescence
- Journal Volume
- 128
- Journal Issue
- 1
- Journal Page Range
- p. 123-128
- ISSN
- 0022-2313
- CODEN
- JLUMA8
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39073243
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BINDING ENERGY; CADMIUM SELENIDES; MEV RANGE 01-10; MOLECULAR BEAM EPITAXY; PHONONS; PHOTOLUMINESCENCE; RED SHIFT; TEMPERATURE DEPENDENCE; THIN FILMS
- Descriptors DEC
- CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL GROWTH METHODS; EMISSION; ENERGY; ENERGY RANGE; EPITAXY; FILMS; LUMINESCENCE; MEV RANGE; PHOTON EMISSION; QUASI PARTICLES; SELENIDES; SELENIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.