Published 1996 | Version v1
Miscellaneous

The development of micro γ detector and electronic circuit for ICT

  • 1. Institute of Nuclear Physics and Chemistry of CAEP, Chengdu (China)

Description

The report presents the principle, structure and performance of micro γ detector and electronic circuit for ICT (Industry Computer Tomography), which is mechanical-electrical united, small in volume, and easy to set in arrays

Part of:
Proceedings of 8. national conference on nuclear electronic and nuclear detection technology: Pt.1

Additional details

Publishing Information

Imprint Title
Proceedings of 8. national conference on nuclear electronic and nuclear detection technology: Pt.1
Imprint Pagination
348 p.
Journal Page Range
p. 266-270.

Conference

Title
8. national conference on nuclear electronics and nuclear detection technology.
Dates
2-7 Dec 1996.
Place
Zhuhai, GD (China).

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
28055495
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
COMPUTERIZED TOMOGRAPHY; ELECTRONIC CIRCUITS; GAMMA DETECTION; INDUSTRIAL RADIOGRAPHY; MINIATURIZATION; PERFORMANCE TESTING; SCINTILLATION COUNTERS
Descriptors DEC
DETECTION; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; RADIATION DETECTION; RADIATION DETECTORS; TESTING; TOMOGRAPHY

Optional Information