Published April 6, 2005 | Version v1
Journal article

Sub Microsecond Notching of a Negative Hydrogen Beam at Low Energy Utilizing a Magnetron Ion Source with a Split Extractor

  • 1. Fermi National Accelerator Laboratory, P.O. 500, Batavia IL 60510 (United States)

Description

A technique for sub-microsecond beam notching is being developed at 20 keV utilizing a Magnetron ion source with a slit extraction system and a split extractor. Each half of the extractor is treated as part of a 50 ohm transmission line which can be pulsed at ±700 volts creating a 1400 volt gradient. This system along with the associated electronics is electrically floated on top of a pulsed extraction voltage. A beam reduction of 95% has been observed at the end of the Fermilab 400 MeV Linac and 35% notching has recently been achieved in the Booster

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
763
Journal Issue
1
Journal Page Range
p. 189-193
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
10. international symposium on production and neutralization of negative ions and beams
Dates
14-17 Sep 2004
Place
Kiev (Ukraine)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36073632
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANIONS; EXTRACTION; FERMILAB; HYDROGEN; HYDROGEN IONS; ION BEAMS; ION SOURCES; KEV RANGE; LINEAR ACCELERATORS; MAGNETRONS; MEV RANGE
Descriptors DEC
ACCELERATORS; BEAMS; CHARGED PARTICLES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; ENERGY RANGE; EQUIPMENT; IONS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NATIONAL ORGANIZATIONS; NONMETALS; SEPARATION PROCESSES; US DOE; US ORGANIZATIONS

Optional Information

Notes
(c) 2005 American Institute of Physics