Published February 2006
| Version v1
Journal article
Study of intense pulsed ion beam mixing with RBS
- 1. Institute of Heavy Ion Physics, Beijing Univ. and Key Laboratory of Heavy Ion Physics, Ministry of Education, Beijing (China)
- 2. Beijing Univ. of Aeronautic and Astronautic, Beijing (China). School of Science, Dept. of Applied Physics
Description
The mixing effect of three different film/substrate systems, Ti/Al, Al/Ti and Ni/Ti, which were irradiated by intense pulsed ion beam, was studied with Rutherford backscattering spectroscopy (RBS). It was found that a quite well mixed layer with gradient components was formed in Ni/Ti combination. The thickness of the mixing layer is far beyond the ion range. They were mixed probably in molten state. It was also found that the mixing degree strongly related to the difference of the melting points of film/substrate couple, as well as the deference of the surface tensions. (authors)
Additional details
Publishing Information
- Journal Title
- Nuclear Techniques
- Journal Volume
- 29
- Journal Issue
- 2
- Journal Page Range
- p. 125-128
- ISSN
- 0253-3219
INIS
- Country of Publication
- China
- Country of Input or Organization
- China
- INIS RN
- 37107806
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- FILMS; ION BEAMS; LAYERS; MELTING POINTS; MIXING; PULSED IRRADIATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; SURFACE TENSION; THICKNESS
- Descriptors DEC
- BEAMS; DIMENSIONS; IRRADIATION; PHYSICAL PROPERTIES; SPECTROSCOPY; SURFACE PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION TEMPERATURE
Optional Information
- Notes
- 4 figs., 3 tabs., 11 refs.