Published March 16, 1983 | Version v1
Patent Metadata-only

Device for in-situ measurements of the lateral distribution of radiation

Creators

Description

The invention is aimed at determining the lateral distribution of radiation with high accuracy and less expenses. Its special fields of application are atomic, molecular, and ion beam profile determination, homogeneity controls in ion implantation, and light intensity distribution in laser beams. The aim could be achieved by refraining from external signal pre-amplification and changing the design of the detecting elements

Availability note (English)

Available from BUCHEXPORT, DDR-7010 Leipzig.

Additional details

Additional titles

Original title (German)
Einrichtung zur in-situ-Messung der lateralen Verteilung von Strahlung

Publishing Information

Imprint Pagination
vp.
IPC:
Int. Cl. G01t1/28.
IPC
Int. Cl. G01t1/28.
Patent number
DD patent document 159570/A/

INIS

Country of Publication
German Democratic Republic
Country of Input or Organization
German Democratic Republic
INIS RN
14764908
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ATOMIC BEAMS; DEPTH; ION BEAMS; ION IMPLANTATION; LASER RADIATION; MOLECULAR BEAMS; PHYSICAL RADIATION EFFECTS; RADIATION DETECTION; SPATIAL DISTRIBUTION
Descriptors DEC
BEAMS; DIMENSIONS; DISTRIBUTION; ELECTROMAGNETIC RADIATION; RADIATION EFFECTS; RADIATIONS