Hardware based contrast enhancement and cupping reduction in industrial MeV Cone Beam Computed Tomography
Creators
- 1. Empa, Swiss Federal Laboratories for Materials Science and Technology, Center for X-ray Analytics, Überlandstrasse 129, 8600 Dübendorf (Switzerland)
- 2. Fraunhofer Development Center for X-ray Technology EZRT, Flugplatzstr. 75, 90768 Fürth (Germany)
- 3. Chair of X-ray Microscopy, University Würzburg, Josef-Martin-Weg 63, 97074 Würzburg (Germany)
Description
This work investigates a detector sided filter concept for contrast enhancement and cupping reduction in an industrial Mega Electronvolt (MeV) Cone Beam Computed Tomography (CBCT) system employing a 6 MeV linear accelerator source and a commercial Gadox based flat panel imager. The method was evaluated using a steel step cylinder sample in order to test the efficiency of the hardware based improvement for various material transmission lengths. An overall improvement of the reconstructed signal for the suggested detector filter configurations with respect to the non-filtered measurements can be observed. Furthermore, equivalent source sided filtrations are shown to be less effective than their detector sided counterpart. Of the detector filter configurations studied in this work, a 2 mm lead filter caused the maximal contrast enhancement, while a 5 mm copper filter lead to better results with regard to cupping artefact reduction.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2021.165044Additional details
Identifiers
- DOI
- 10.1016/j.nima.2021.165044;
- PII
- S0168900221000280;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 994
- Journal Page Range
- vp.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54011845
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- COMPUTERIZED SIMULATION; COMPUTERIZED TOMOGRAPHY; CONFIGURATION; COPPER; CYLINDERS; FILTERS; FILTRATION; LINEAR ACCELERATORS; MEV RANGE; MONTE CARLO METHOD; SIGNALS; STEELS; X RADIATION
- Descriptors DEC
- ACCELERATORS; ALLOYS; CALCULATION METHODS; CARBON ADDITIONS; DIAGNOSTIC TECHNIQUES; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONIZING RADIATIONS; IRON ALLOYS; IRON BASE ALLOYS; METALS; RADIATIONS; SEPARATION PROCESSES; SIMULATION; TOMOGRAPHY; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2021 The Author(s). Published by Elsevier B.V.