Published April 2021 | Version v1
Journal article

Hardware based contrast enhancement and cupping reduction in industrial MeV Cone Beam Computed Tomography

  • 1. Empa, Swiss Federal Laboratories for Materials Science and Technology, Center for X-ray Analytics, Überlandstrasse 129, 8600 Dübendorf (Switzerland)
  • 2. Fraunhofer Development Center for X-ray Technology EZRT, Flugplatzstr. 75, 90768 Fürth (Germany)
  • 3. Chair of X-ray Microscopy, University Würzburg, Josef-Martin-Weg 63, 97074 Würzburg (Germany)

Description

This work investigates a detector sided filter concept for contrast enhancement and cupping reduction in an industrial Mega Electronvolt (MeV) Cone Beam Computed Tomography (CBCT) system employing a 6 MeV linear accelerator source and a commercial Gadox based flat panel imager. The method was evaluated using a steel step cylinder sample in order to test the efficiency of the hardware based improvement for various material transmission lengths. An overall improvement of the reconstructed signal for the suggested detector filter configurations with respect to the non-filtered measurements can be observed. Furthermore, equivalent source sided filtrations are shown to be less effective than their detector sided counterpart. Of the detector filter configurations studied in this work, a 2 mm lead filter caused the maximal contrast enhancement, while a 5 mm copper filter lead to better results with regard to cupping artefact reduction.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2021.165044

Additional details

Identifiers

DOI
10.1016/j.nima.2021.165044;
PII
S0168900221000280;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
994
Journal Page Range
vp.
ISSN
0168-9002
CODEN
NIMAER

Optional Information

Copyright
Copyright (c) 2021 The Author(s). Published by Elsevier B.V.