Published December 31, 2003 | Version v1
Journal article

Charge corrections for supercell calculations of defects in semiconductors

Description

We investigate the validity of the Makov-Payne correction if applied to supercell calculations for charged defects by comparing the results of a supercell calculations with those obtained using a Green's function approach. For several defects in 3C-SiC the observed energy differences between both calculations are not bridged by the corrections of Makov-Payne. Whereas a correction proportional to the defect charge squared is predicted, the observed differences between supercell and Green's function approaches depend almost linearly on the charge. Possible reasons for this discrepancy are discussed

Additional details

Identifiers

DOI
10.1016/j.physb.2003.09.111;
PII
S0921452603007592;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
340-342
Journal Issue
3-4
Journal Page Range
p. 190-194
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
22. international conference on defects in semiconductors
Dates
28 Jul - 1 Aug 2003
Place
Aarhus (Denmark)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36112829
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BOUNDARY CONDITIONS; CORRECTIONS; CRYSTAL DEFECTS; GREEN FUNCTION; PERIODICITY; SEMICONDUCTOR MATERIALS; SILICON CARBIDES
Descriptors DEC
CARBIDES; CARBON COMPOUNDS; CRYSTAL STRUCTURE; FUNCTIONS; MATERIALS; SILICON COMPOUNDS; VARIATIONS

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.