Published December 31, 2003
| Version v1
Journal article
Charge corrections for supercell calculations of defects in semiconductors
Description
We investigate the validity of the Makov-Payne correction if applied to supercell calculations for charged defects by comparing the results of a supercell calculations with those obtained using a Green's function approach. For several defects in 3C-SiC the observed energy differences between both calculations are not bridged by the corrections of Makov-Payne. Whereas a correction proportional to the defect charge squared is predicted, the observed differences between supercell and Green's function approaches depend almost linearly on the charge. Possible reasons for this discrepancy are discussed
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2003.09.111;
- PII
- S0921452603007592;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 340-342
- Journal Issue
- 3-4
- Journal Page Range
- p. 190-194
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 22. international conference on defects in semiconductors
- Dates
- 28 Jul - 1 Aug 2003
- Place
- Aarhus (Denmark)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36112829
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BOUNDARY CONDITIONS; CORRECTIONS; CRYSTAL DEFECTS; GREEN FUNCTION; PERIODICITY; SEMICONDUCTOR MATERIALS; SILICON CARBIDES
- Descriptors DEC
- CARBIDES; CARBON COMPOUNDS; CRYSTAL STRUCTURE; FUNCTIONS; MATERIALS; SILICON COMPOUNDS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.