Elastic and inelastic mean free paths of 200 keV electrons in metallic glasses
Creators
Description
The elastic and inelastic mean free paths of three metallic glass alloys, Ni60Nb40, Pd82Si18 and Ni80P20, have been measured from focused ion beam prepared thin samples with measured thickness gradients. The elastic/inelastic mean free paths of the three alloys are 35±0.5/97±3, 26±0.5/148±3 and 40±0.5/129±2.5 nm, respectively. Elastic mean free paths predicted from atomic scattering cross sections consistently underestimate the experimental data. A model based on the Wentzel atomic model was developed and the fit to available data is in much better agreement with experiments, with a maximum deviation of ~4 nm. The parametrized model is thus capable of predicting the elastic mean free path for other amorphous materials. Existing models for the inelastic mean free path are not in good agreement with the experimental data. - Highlights: • The elastic and inelastic mean free paths of three metallic glass alloys, Ni60Nb40, Pd82Si18 and Ni80P20, have been measured using focused ion beam prepared samples. • The elastic/inelastic mean free paths of the three alloys are 35±0.5/97±3, 26±0.5/148±3 and 40±0.5/129±2.5 nm. • A parameterized phenomenological model was developed to predict the EMFP of other amorphous materials with an effective atomic number between19 and 43.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2016.09.005Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2016.09.005;
- PII
- S0304-3991(16)30192-9;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 171
- Journal Page Range
- p. 89-95
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48085971
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALLOYS; AMORPHOUS STATE; ATOMIC MODELS; CROSS SECTIONS; ELASTIC SCATTERING; ELECTRONS; INELASTIC SCATTERING; ION BEAMS; KEV RANGE 100-1000; MEAN FREE PATH; METALLIC GLASSES; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; ENERGY RANGE; FERMIONS; KEV RANGE; LEPTONS; MATHEMATICAL MODELS; MICROSCOPY; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.