Published 1985 | Version v1
Journal article Metadata-only

Radiation-hardened integrated circuit development at Texas Instruments

Creators

  • 1. Texas Instruments Inc., Dallas, TX

Description

no abstract available

Additional details

Publishing Information

Journal Title
Trans. Am. Nucl. Soc.
Journal Volume
49
Series
Trans. Am. Nucl. Soc.
Journal Page Range
24-25
ISSN
0003-018X
CODEN
TANSA

Conference

Title
Annual meeting of the American Nuclear Society.
Dates
9-14 Jun 1985.
Place
Boston, MA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
17027583
Subject category
S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
GAMMA RADIATION; INTEGRATED CIRCUITS; IRRADIATION; RADIATION HARDENING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR MATERIALS; TRANSISTORS
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; HARDENING; IONIZING RADIATIONS; MATERIALS; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS; RADIATIONS

Optional Information

Notes
Published in summary form only.
Secondary number(s)
CONF-850610--.